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12/30/2021
Registration-free localization of defects in 3-D parts from mesh metrology data using functional maps
Spectral Laplacian methods, widely used in computer graphics and manifol...
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01/07/2021
A Registration-free approach for Statistical Process Control of 3D scanned objects via FEM
Recent work in on-line Statistical Process Control (SPC) of manufactured...
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06/28/2019
