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08/16/2023
Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review
A growing need exists for efficient and accurate methods for detecting d...
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08/14/2023
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection
Continual shrinking of pattern dimensions in the semiconductor domain is...
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07/28/2023
YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach
Shrinking pattern dimensions leads to an increased variety of defect typ...
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04/26/2023
A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation
Innovative Electronic Design Automation (EDA) solutions are important to...
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02/19/2023
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering
In this study, we applied the PointRend (Point-based Rendering) method t...
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02/19/2023
Optimizing YOLOv7 for Semiconductor Defect Detection
The field of object detection using Deep Learning (DL) is constantly evo...
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11/03/2022