Unsupervised seismic facies classification using deep convolutional autoencoder

08/05/2020
by   Vladimir Puzyrev, et al.
0

With the increased size and complexity of seismic surveys, manual labeling of seismic facies has become a significant challenge. Application of automatic methods for seismic facies interpretation could significantly reduce the manual labor and subjectivity of a particular interpreter present in conventional methods. A recently emerged group of methods is based on deep neural networks. These approaches are data-driven and require large labeled datasets for network training. We apply a deep convolutional autoencoder for unsupervised seismic facies classification, which does not require manually labeled examples. The facies maps are generated by clustering the deep-feature vectors obtained from the input data. Our method yields accurate results on real data and provides them instantaneously. The proposed approach opens up possibilities to analyze geological patterns in real time without human intervention.

READ FULL TEXT

page 20

page 21

research
11/23/2017

DeepPainter: Painter Classification Using Deep Convolutional Autoencoders

In this paper we describe the problem of painter classification, and pro...
research
12/02/2019

Inversion of 1D frequency- and time-domain electromagnetic data with convolutional neural networks

Inversion of electromagnetic data finds applications in many areas of ge...
research
08/15/2016

Star-galaxy Classification Using Deep Convolutional Neural Networks

Most existing star-galaxy classifiers use the reduced summary informatio...
research
10/16/2018

Deep Neural Maps

We introduce a new unsupervised representation learning and visualizatio...
research
09/06/2022

Crowdsourced-based Deep Convolutional Networks for Urban Flood Depth Mapping

Successful flood recovery and evacuation require access to reliable floo...
research
07/07/2020

Unsupervised Data Extraction from Computer-generated Documents with Single Line Formatting

Processing large amounts of data is an essential problem of the big data...
research
07/15/2021

One-Class Classification for Wafer Map using Adversarial Autoencoder with DSVDD Prior

Recently, semiconductors' demand has exploded in virtual reality, smartp...

Please sign up or login with your details

Forgot password? Click here to reset