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Semiconductors and Dirichlet-to-Neumann maps

01/22/2021

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by A. Leitao, et al.

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We investigate the problem of identifying discontinuous doping profiles in semiconductor devices from data obtained by the stationary voltage-current (VC) map. The related inverse problem correspond to the inverse problem for the Dirichlet-to-Neumann (DN) map with partial data.

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