Convolutional Ensembling based Few-Shot Defect Detection Technique
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Over the past few years, there has been a significant improvement in the domain of few-shot learning. This learning paradigm has shown promising results for the challenging problem of anomaly detection, where the general task is to deal with heavy class imbalance. Our paper presents a new approach to few-shot classification, where we employ the knowledge-base of multiple pre-trained convolutional models that act as the backbone for our proposed few-shot framework. Our framework uses a novel ensembling technique for boosting the accuracy while drastically decreasing the total parameter count, thus paving the way for real-time implementation. We perform an extensive hyperparameter search using a power-line defect detection dataset and obtain an accuracy of 92.30 on competing standards with the existing state-of-the-art methods and outperform them.
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