Compressive sensing on diverse STEM scans: real-time feedback, low-dose and dynamic range

05/13/2018
by   Xin Li, et al.
0

Scanning Transmission Electron Microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to mapping order parameter fields. In the last several years, attention was attracted by potential of STEM to explore beam induced chemical processes and especially manipulating atomic motion, enabling atom-by-atom fabrication. These applications, as well as traditional imaging of beam sensitive materials, necessitate increasing dynamic range of STEM between imaging and manipulation modes, and increasing absolute scanning/imaging speeds, that can be achieved by combining sparse sensing methods with non-rectangular scanning trajectories. Here we developed a general method for real-time reconstruction of sparsely sampled images from high-speed, non-invasive and diverse scanning pathways. This approach is demonstrated on both the synthetic data where ground truth is known and the experimental STEM data. This work lays the foundation for future tasks such as optimal design of dose efficient scanning strategies and real-time adaptive inference and control of e-beam induced atomic fabrication.

READ FULL TEXT
POST COMMENT

Comments

There are no comments yet.

Authors

page 7

page 8

page 10

page 11

page 16

page 17

page 18

04/29/2021

Differentiable model-based adaptive optics for two-photon microscopy

Aberrations limit scanning fluorescence microscopy when imaging in scatt...
06/27/2017

Reduced Electron Exposure for Energy-Dispersive Spectroscopy using Dynamic Sampling

Analytical electron microscopy and spectroscopy of biological specimens,...
02/27/2018

Reconstruction of partially sampled multi-band images - Application to STEM-EELS imaging

Electron microscopy has shown to be a very powerful tool to map the chem...
12/13/2011

Data Processing For Atomic Resolution EELS

The high beam current and sub-angstrom resolution of aberration-correcte...
06/23/2021

Finding simplicity: unsupervised discovery of features, patterns, and order parameters via shift-invariant variational autoencoders

Recent advances in scanning tunneling and transmission electron microsco...
02/04/2020

Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling

This paper discusses the reconstruction of partially sampled spectrum-im...
10/31/2019

Accounting for Location Measurement Error in Atomic Resolution Images of Crystalline Materials

Scanning transmission electron microscopy can directly image the atomic ...

Code Repositories

This week in AI

Get the week's most popular data science and artificial intelligence research sent straight to your inbox every Saturday.