Automated and Autonomous Experiment in Electron and Scanning Probe Microscopy

03/22/2021
by   Sergei V. Kalinin, et al.
0

Machine learning and artificial intelligence (ML/AI) are rapidly becoming an indispensable part of physics research, with domain applications ranging from theory and materials prediction to high-throughput data analysis. In parallel, the recent successes in applying ML/AI methods for autonomous systems from robotics through self-driving cars to organic and inorganic synthesis are generating enthusiasm for the potential of these techniques to enable automated and autonomous experiment (AE) in imaging. Here, we aim to analyze the major pathways towards AE in imaging methods with sequential image formation mechanisms, focusing on scanning probe microscopy (SPM) and (scanning) transmission electron microscopy ((S)TEM). We argue that automated experiments should necessarily be discussed in a broader context of the general domain knowledge that both informs the experiment and is increased as the result of the experiment. As such, this analysis should explore the human and ML/AI roles prior to and during the experiment, and consider the latencies, biases, and knowledge priors of the decision-making process. Similarly, such discussion should include the limitations of the existing imaging systems, including intrinsic latencies, non-idealities and drifts comprising both correctable and stochastic components. We further pose that the role of the AE in microscopy is not the exclusion of human operators (as is the case for autonomous driving), but rather automation of routine operations such as microscope tuning, etc., prior to the experiment, and conversion of low latency decision making processes on the time scale spanning from image acquisition to human-level high-order experiment planning.

READ FULL TEXT

page 5

page 8

page 12

page 17

page 19

page 24

page 31

page 34

research
04/04/2023

Deep Learning for Automated Experimentation in Scanning Transmission Electron Microscopy

Machine learning (ML) has become critical for post-acquisition data anal...
research
09/30/2021

An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics

Artificial intelligence (AI) promises to reshape scientific inquiry and ...
research
10/12/2022

Microscopy is All You Need

We pose that microscopy offers an ideal real-world experimental environm...
research
05/30/2022

Bayesian Active Learning for Scanning Probe Microscopy: from Gaussian Processes to Hypothesis Learning

Recent progress in machine learning methods, and the emerging availabili...
research
03/21/2019

Scanning Probe State Recognition With Multi-Class Neural Network Ensembles

One of the largest obstacles facing scanning probe microscopy is the con...
research
01/18/2023

Using CycleGANs to Generate Realistic STEM Images for Machine Learning

The rise of automation and machine learning (ML) in electron microscopy ...
research
07/31/2019

Embedding Human Heuristics in Machine-Learning-Enabled Probe Microscopy

Scanning probe microscopists generally do not rely on complete images to...

Please sign up or login with your details

Forgot password? Click here to reset