A New Knowledge Distillation Network for Incremental Few-Shot Surface Defect Detection
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Surface defect detection is one of the most essential processes for industrial quality inspection. Deep learning-based surface defect detection methods have shown great potential. However, the well-performed models usually require large training data and can only detect defects that appeared in the training stage. When facing incremental few-shot data, defect detection models inevitably suffer from catastrophic forgetting and misclassification problem. To solve these problems, this paper proposes a new knowledge distillation network, called Dual Knowledge Align Network (DKAN). The proposed DKAN method follows a pretraining-finetuning transfer learning paradigm and a knowledge distillation framework is designed for fine-tuning. Specifically, an Incremental RCNN is proposed to achieve decoupled stable feature representation of different categories. Under this framework, a Feature Knowledge Align (FKA) loss is designed between class-agnostic feature maps to deal with catastrophic forgetting problems, and a Logit Knowledge Align (LKA) loss is deployed between logit distributions to tackle misclassification problems. Experiments have been conducted on the incremental Few-shot NEU-DET dataset and results show that DKAN outperforms other methods on various few-shot scenes, up to 6.65 mean Average Precision metric, which proves the effectiveness of the proposed method.
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